Using the Amplitude Fidelity Reading for Total Focusing Method (TFM) Grid Resolution Definition in the OmniScan® X3 Flaw Detector

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Using the Amplitude Fidelity Reading for Total Focusing Method (TFM) Grid Resolution Definition in the OmniScan® X3 Flaw Detector
Using the Amplitude Fidelity Reading for Total Focusing Method (TFM) Grid Resolution Definition in the OmniScan® X3 Flaw Detector

Introducing the latest member of the Olympus OmniScan™ family. Confidence you can see. That’s the phrase we use to describe the new OmniScan™ X3 flaw detector.

What does it mean? It’s our way of saying that the power of this OmniScan™ to help you feel confident that you’ve made the right call comes from what you can see on the screen. On top of its high-quality, highly detailed imaging, the OmniScan™ X3 flaw detector is packed full of innovative simulation and visualization tools that enable you to verify and validate your inspection on the spot. It’s not just an upgrade from the MX2—it’s a complete phased array toolbox. There has never been a worse time to be a defect thanks to the instrument’s advanced imaging and analysis capabilities.

The following whitepaper refers to the correct use of the amplitude fidelity reading for total focusing method grid resolution definition in the OmniScan™ X3 flaw detector.

Have a good read.
 

Posted on January 15, 2020 - (830 views)
Olympus Europa SE & CO.KG
Amsinckstraße 63
20097 Hamburg - Germany
+49-40-237730
+49-40-230817
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Description

Olympus Industrial Solutions provides testing technologies including remote visual inspection (RVI), microscopy (IE), ultrasound (UT), phased array (PA), eddy current (EC), eddy current array (ECA), X-ray fluorescence (XRF) and optical metrology.

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