The Time Delay Integration (TDI) method significantly improves image sensitivity, making it highly effective in low-light conditions and when capturing fast-moving objects. By synchronising charge transfer on the image sensor with motion, TDI increases sensitivity, reduces blur, and produces sharp, high-resolution images, even in challenging environments.
Customized to perform
Custom TDI image sensors offer fast line scan rates, enhanced sensitivity and accurate detection across the full spectrum, from UV to near-IR. SI Sensors' solutions combine the sensitivity of TDI-CCD with the high-speed digital output and system-on-chip functionality of CMOS technology, drawing on considerable experience with CCD-CMOS processes across multiple foundries. SI Sensors offers a range of customisation options, including tailored pixel architectures for optimised sensitivity, column-parallel readouts for faster operation, and application-specific features such as fibre-coupled interfaces or specialised coatings for low-light, wavelength-specific or X-ray imaging.
Extensive in-house IP and design experience together with the latest software tools is used to design novel image sensors, employing the most appropriate global foundry technologies, achieving the best balance between image sensor performance and cost for every customer.
