Laser Scanning Microscopes

The Olympus opto-digital range has been designed to combine operating simplicity with advanced optics and high precision for non-contact, non-destructive metrology and inspection. The systems feature simple on-screen visualisation and touch-screen capabilities in place of eyepieces for universal ease-of-use and minimal user training. The LEXT OLS4100 3D laser scanning microscope for surface metrology includes an ultra-fast mode enabling the measurement of micro-samples with very steep angles, and a multi-layer mode to facilitate observation and measurement of challenging transparent samples. The DSX systems, suitable for the inspection of a large range of sample types, sizes and weights, automatically generate a selection of previews for each imaging technique, allowing the user to quickly select the best imaging approach. This facilitates the rapid and simple identification of the inspection detail required.