Laser Scanning Microscopes

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Laser Scanning Microscopes
Laser Scanning Microscopes

The Olympus opto-digital range has been designed to combine operating simplicity with advanced optics and high precision for non-contact, non-destructive metrology and inspection. The systems feature simple on-screen visualisation and touch-screen capabilities in place of eyepieces for universal ease-of-use and minimal user training. The LEXT OLS4100 3D laser scanning microscope for surface metrology includes an ultra-fast mode enabling the measurement of micro-samples with very steep angles, and a multi-layer mode to facilitate observation and measurement of challenging transparent samples. The DSX systems, suitable for the inspection of a large range of sample types, sizes and weights, automatically generate a selection of previews for each imaging technique, allowing the user to quickly select the best imaging approach. This facilitates the rapid and simple identification of the inspection detail required.

Posted on May 16, 2014 - (664 views)
by
Olympus Europa SE & CO.KG
Amsinckstraße 63
20097 Hamburg - Germany
+49-40-237730
+49-40-230817
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Description

Olympus Industrial Solutions provides testing technologies including remote visual inspection (RVI), microscopy (IE), ultrasound (UT), phased array (PA), eddy current (EC), eddy current array (ECA), X-ray fluorescence (XRF) and optical metrology.

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