Image Analysis Software

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Efficient microscopy imaging for industrial materials science applications

Vision & Identification

Image Analysis Software
Image Analysis Software

Olympus’ new Stream 2.2 software version offers a flexible functionality for digital image acquisition, image processing, analysis and evaluation, image archiving, document management and report generation.

Digital inspection for higher objectivity

Demands within industrial production and maintenance regarding product quality, process assurance and economic profitability are rising steadily. Industrial quality and process assurance programs are based on proven methods, on the knowledge and evaluative skills of experts, as well as on strict national and international standards. A digital inspection approach can provide significantly higher objectivity and reproducibility compared to conventional inspection methods.

Supports all kinds of industrial microscopes

Olympus Stream 2.2 focuses strongly on the high and specific demands on reporting measurements and analysis results in the field of industrial and materials science applications. It is compatible with Windows 10 and supports MS Office 2016 for creating reports. The new version works perfectly with all industrial microscopes, such as the Olympus BX3M series of upright metallurgical microscopes, which had been launched this year with many new features focusing strongly on the seamless interfaces between hardware and software. Customers have also free choice within the broad range of Olympus digital cameras that are exclusively designed for microscopes. This includes the new cost-effective, entry-level Olympus LC30 colour microscope camera and the new high-end Olympus DP74 colour camera, which offers the highest quality and very convenient features like LiveHDR.

Posted on January 13, 2017 - (1946 views)
Olympus Europa SE & CO.KG
Amsinckstraße 63
20097 Hamburg - Germany
+49-40-237730
+49-40-230817
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Description

Olympus Industrial Solutions provides testing technologies including remote visual inspection (RVI), microscopy (IE), ultrasound (UT), phased array (PA), eddy current (EC), eddy current array (ECA), X-ray fluorescence (XRF) and optical metrology.

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