Yamaichi Electronics presents Kelvin test contactors in QFN, SOP and QFP packages for use in the lab and on the test floor. The arms race in thin and lightweight, but still powerful consumer devices such as smartphones relies on high integrity of sensitive functions on a semiconductor component. For the semiconductor manufacturer to be able to guarantee that functionality, the test equipment has to be correspondingly powerful. The new test contactors with Kelvin pins ensure that these IC components can be tested reliably.
With the YED274 Kelvin test contactor series, Yamaichi Electronics is offering a wide spectrum of products. The test contactors, with Kelvin fine-pitch pins, are available as test sockets with fixed covers for manual component testing, but also in different variants adapted to the component handler for volume testing. The fine-pitch Kelvin pins are used for QFN, SOP and QFP components. To ensure the reliable contacting of component pad alloys, the pin plungers are made of hardened steel with a palladium or gold surface. The pin force of 28gf breaks reliably through the oxide in the temperature range from -55 to +150 °C.
The outstanding service life of the pin is complemented by a contact resistance of ≤ 50 mOhm.
The materials of the test contactors are selected to compensate for even large temperature spikes. The successful Y-RED® product line is the template for test contactors in the lab. The YED274 Kelvin series includes many useful features. The test contactors for automated volume testing can be adapted for nearly any component handler.